Growth and Properties of (001)-oriented Pb(Zr0.52Ti0.48)O3/LaNiO3 Films on Si(001) Substrates with TiN Buffer Layers

نویسندگان

  • Tie-Jun Zhu
  • Li Lu
  • C. V. Thompson
چکیده

Pulsed laser deposition has been used to grow Pb(Zr0.52Ti0.48)O3 (PZT)/LaNiO3 (LNO) heterostructures with restricted crystallographic orientations on bare Si(001) and SiO2-coated Si(001) substrates, using TiN buffer layers. The effect of background gas pressure on orientation of the thin films was investigated in detail. XRD analyses showed that under optimized conditions, (001)-oriented PZT/LNO/TiN heterostructures could be grown on either Si(001) or SiO2/Si substrates. The (001)-textured PZT films had remnant polarizations as high as 23μC/cm, and also had a low coercive field. Up to 10 switching cycles have been achieved in these PZT films.

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تاریخ انتشار 2003